4 point probe |
1224A3 |
Ryan Anderson |
Bruker Dektak XT |
1224B1 |
Dr. Vishal Narang |
HP 4155A Semiconductor Parameter Analyzer and Probe Station |
1224A3 |
Ryan Anderson |
J.A. Woollam M-2000 Ellipsometer |
1224A3 |
Dr. Chan Ho Kim |
Nanometrics Nanospec |
1224B1 |
Dr. Vishal Narang |