Nanometrics Nanospec

Nanometrics Nanospec
Location
1224B1
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Fast and easy to learn, the Nanometrics “Nanospec” Reflectometer can determine the thickness and refractive index of a thin film. The most common applications are measuring the thickness of photoresist, Silicon Oxide or Silicon Nitride. It also has surprisingly good precision determining the refractive index of a film, even with unknown thickness.