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The Keyence VK-X3000 is a cutting-edge 3D surface profiler that delivers nanometer-level precision across a broad range of materials and surface types. Utilizing a unique triple scan approach—combining laser confocal scanning, white light interferometry, and focus variation—the VK-X3000 enables accurate, non-contact measurements from the nanometer to millimeter scale.
Designed for versatility, the VK-X3000 can measure steep slopes and complex geometries. It offers best-in-class XY resolution and a height resolution down to 0.01 nm, with scanning areas up to 50 × 50 mm.
Its intuitive software automates measurement and analysis, making it ideal for applications in R&D, quality control, and failure analysis across industries such as semiconductors, medical devices, and materials science.