Probe station

In tandem with the HP 4155A semiconductor parameter analyzer, this probe station can perform general semiconductor parameter testing up to 4-terminals. The probe station is a Micromanipulator station with a 4″ diameter vacuum chuck. Four probes are provided.  The probe station has four highly configurable XYZ probes with exchangeable probe tips, a six inch wafer chuck and chuck heater up to 300C.  The probes are connected to our HP4155 Device Analyzer.