Recent Research

[iframe src="http://research.engineering.ucdavis.edu/cnm2/wp-content/uploads/sites/11/2014/11/EBL-on-the-FEI-NovaNano.pdf" scrolling="yes" width="1050" height="700"] This poster shows recent characterization data for E-beam Lithography on our FEI Nova-Nano SEM. The results can be used for fabricating nanotechnology devices. You can also view this poster as a stand-alone PDF here:  EBL on the FEI NovaNano SEM